Title
A Fault Analytic Method Against HB+
Publication Date
2011
Document Type
Article
Abstract
The search for lightweight authentication protocols suitable for low-cost RFID tags constitutes an active and challenging research area. In this context, a family of protocols based on the LPN problem has been proposed: the so-called HB-family. Despite the rich literature regarding the cryptanalysis of these protocols, there are no published results about the impact of fault analysis over them. The purpose of this paper is to fill this gap by presenting a fault analytic method against a prominent member of the HB-family: HB+ protocol. We demonstrate that the fault analysis model can lead to a flexible and effective attack against HB-like protocols, posing a serious threat over them.
Publication Title
IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences
Volume
E94-A
Issue
2
First Page
855
Last Page
859
DOI
10.1587/transfun.E94.A.855
Publisher Policy
publisher's pdf
Recommended Citation
Carrijo, José; Tonicelli, Rafael; and Nascimento, Anderson C.A., "A Fault Analytic Method Against HB+" (2011). School of Engineering and Technology Publications. 49.
https://digitalcommons.tacoma.uw.edu/tech_pub/49
